Lecture 2:半导体基础

半导体的定义与晶体结构、能带理论与带隙、电子与空穴、态密度、掺杂、热平衡、费米狄拉克统计与载流子浓度

What is Semiconductor | 什么是半导体

  1. Conductivity lies between that of conductors (导体) and insulators (绝缘体).
  2. Generally crystalline in structure for IC devices | 在集成电路器件中通常呈晶体结构。
  • In recent years, however, non-crystalline semiconductors (非晶半导体) have become commercially important (具有商业价值).
  • Graphene | 石墨烯

Typical Semiconductor | 典型半导体

  1. Silicon: diamond cubic structure | 金刚石立方结构
  2. GaAs: ZnS (Zinc Blende) structure | 闪锌矿结构

How Many Silicon Atoms per cm³?

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等效硅原子在一个立方晶格中是 8 个,每个立方晶格占地 (0.543nm)3(0.543\,\text{nm})^3,于是可求 Si 的数密度为 5×1022cm35\times10^{22}\,\text{cm}^{-3}

Compound (or elemental) Semiconductors | 化合(或元素)半导体

  • A compound semiconductor is a semiconducting material formed from two or more different chemical elements, like GaN.
  • This is different from an elemental semiconductor, like silicon (Si), which is made from only one element.

Energy Band Theory | 能带理论

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根据量子力学,在晶体中,随着相互作用原子数量 NN 的增加,会形成连续的能带。

Result from quantum mechanics: formation of continuous energy bands in a crystal with increasing number of interacting atoms.

Conduction (or valence) band | 导(价)带

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  • 价带:The highest nearly-filled band is the valence band.
  • 导带:The lowest nearly-empty band is the conduction band.

Energy Band Diagram | 能带图

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  • EcE_c: Bottom edge of the conduction band
  • EvE_v: Top edge of the valence band

EcE_c and EvE_v are separated by the band gap energy EGE_G.

Band Gap and Material Classification | 带隙与材料分类

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Filled bands and empty bands do not allow current flow.

  • Insulators have large EGE_G | 绝缘体有很大的 band gap
  • Semiconductors have small EGE_G | 半导体有较小的 band gap
  • Metals have no band gap. Conduction band is partially filled | 金属没有 band gap,导带是被部分填满的

How to Measure Bandgap Energy | 带隙测量

EGE_G can be determined from the minimum energy of photons (光子,注意区分声子 phonon) that are absorbed by the semiconductor.

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Electronic Properties of Si | 硅的电特性

  1. Silicon is a semiconductor material. Pure Si has high electrical resistivity at room temperature. | 纯净 Si 在室温有很高的电阻率
  2. There are 2 types of mobile charge-carriers in Si:
    1. 电子:Conduction electrons are negatively charged;
    2. 空穴:Holes are positively charged.
  3. The concentration of conduction electrons & holes in a semiconductor can be modulated (调整) in several ways | 四种因素会影响载流子浓度
    1. Adding impurity atoms (dopants) | 掺杂
    2. Applying an electric field | 施加电场
    3. Changing the temperature | 改变温度
    4. Irradiation | 辐照

Bond Model of Electrons and Holes | 电子与空穴的键模型

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  • When an electron breaks loose and becomes a conduction electron, a hole is also created.
  • In a pure Si crystal, conduction electrons and holes are formed in pairs.

Hole | 空穴

Mobile positive charge associated with a half-filled covalent bond. (与半填充共价键相关的可移动正电荷)

  • Treat as positively charged mobile particle (粒子) in the semiconductor.

Definition of Terms | 术语定义

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nn = number of electrons per cm3\text{cm}^3

pp = number of holes per cm3\text{cm}^3

nin_i = intrinsic carrier concentration

In a pure semiconductor, n=p=nin = p = n_i

In a doped semiconductor, np=ni2np = n_i^2

Band Theory: Density of States | 态密度

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g(E)dEg(E)\,dE = number of states per cm3\text{cm}^3 in the energy range between EE and E+dEE+dE

gc(E)=mn2mn(EEc)π23,EEcg_c(E) = \frac{m_n^* \sqrt{2m_n^*(E - E_c)}}{\pi^2 \hbar^3}, \quad E \ge E_cgv(E)=mp2mp(EvE)π23,EEvg_v(E) = \frac{m_p^* \sqrt{2m_p^*(E_v - E)}}{\pi^2 \hbar^3}, \quad E \le E_v

mm^* (effective mass) depends on material (材料) and crystallographic orientation (晶向).

Doping in Silicon | 硅掺杂

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By substituting (替代) a Si atom with a special impurity atom (Group V (Donors) or Group III (Acceptors) element), a conduction electron or hole is created.

Donors: P (Phosphorus), As (Arsenic), Sb (Antimony)

Acceptors: B (Boron), Al (Aluminum), Ga (Gallium), In (Indium)

类型元素符号英文名称
施主 (Donors)PPhosphorus (磷)
施主 (Donors)AsArsenic (砷)
施主 (Donors)SbAntimony (锑)
受主 (Acceptors)BBoron (硼)
受主 (Acceptors)AlAluminum (铝)
受主 (Acceptors)GaGallium (镓)
受主 (Acceptors)InIndium (铟)

Donor / Acceptor Levels | 施主/受主能级

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Charge-Carrier Concentrations | 载流子浓度

NDN_D: ionized donor concentration (cm3\text{cm}^{-3})

NAN_A: ionized acceptor concentration (cm3\text{cm}^{-3})

Charge neutrality condition: ND+p=NA+nN_D + p = N_A + n

At thermal equilibrium: np=ni2np = n_i^2 (Law of Mass Action)

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Note: Carrier concentrations depend on net dopant concentration (NDNAN_D - N_A)!

Summary | 小结

donor: impurity atom that increases nn, for example Group-V elements

acceptor: impurity atom that increases pp, for example Group-III elements

n-type material: contains more electrons than holes

p-type material: contains more holes than electrons

majority carrier: the most abundant carrier

minority carrier: the least abundant carrier

intrinsic semiconductor: n=p=nin = p = n_i

extrinsic semiconductor: doped semiconductor, npnin \ne p \ne n_i

Dopant concentrations typically range from 1014cm310^{14}\,\text{cm}^{-3} to 1019cm310^{19}\,\text{cm}^{-3}

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Thermal Equilibrium | 热平衡

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  1. Condition | 条件:
    1. No external forces are applied:
    2. Electric field = 0
    3. Magnetic (磁) field = 0
    4. Mechanical stress (机械应力) = 0
    5. Absolutely no light
  2. Characteristic | 特点
    1. Dynamic situation (动态平衡) in which every process is balanced by its inverse process.
      1. Electron-hole pair (EHP) generation rate = EHP recombination rate
    2. Thermal agitation (热运动): electrons and holes exchange energy with the crystal lattice and each other.
      1. Every energy state in the conduction band and valence band has a certain probability of being occupied by an electron.

动态平衡状态,每个过程都与其逆过程相互平衡。

电子-空穴对(EHP)的生成速率等于其复合速率。

热运动:电子与空穴在晶体晶格中相互交换能量。

导带和价带中的每个能级都有被电子占据的概率。

Fermi-Dirac Statistics | 费米狄拉克统计

Probability that an available state at energy EE is occupied is given by the Fermi-Dirac distribution function:

f(E)=11+e(EEF)/kTf(E) = \frac{1}{1 + e^{(E - E_F) / kT}}

There is only one Fermi level in a system at equilibrium.

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Effect of Temperature on f(E)f(E) | 温度的影响

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Boltzmann Approximation | 玻尔兹曼近似

Probability that a state is filled (occupied by an electron):

{f(E)e(EEF)/kT,EEF>3kTf(E)1e(EEF)/kT,EFE>3kT\begin{cases} f(E) \approx e^{-(E - E_F) / kT}, & E - E_F > 3kT \\ f(E) \approx 1 - e^{(E - E_F) / kT}, & E_F - E > 3kT \end{cases}

Probability that a state is empty (occupied by a hole):

1f(E)e(EEF)/kT=e(EFE)/kT1 - f(E) \approx e^{(E - E_F) / kT} = e^{-(E_F - E) / kT}

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Remember: there is only one Fermi level in a system at equilibrium.

Distribution of Carriers | 载流子分布

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Obtain n(E)n(E) by multiplying gc(E)g_c(E) and f(E)f(E).

Obtain p(E)p(E) by multiplying gv(E)g_v(E) and 1f(E)1-f(E).

n(E)=gc(E)f(E)n(E) = g_c(E)\,f(E)EEcE \ge E_c。靠近 EcE_c 处既有可用态 gcg_c,又有一定占据几率 ff,因此电子主要分布在导带底附近。

p(E)=gv(E)[1f(E)]p(E) = g_v(E)\,[1-f(E)]EEvE \le E_v。靠近 EvE_v1f1-f 较大,因而空穴主要分布在价带顶附近。

N-type Semiconductor Distribution | N 型载流子分布

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Equilibrium Electron Concentration | 平衡电子浓度

n=Nce(EcEF)/kT,where Nc=2(2πmnkTh2)3/2n = N_c\, e^{-(E_c - E_F) / kT}, \quad \text{where } N_c = 2 \left( \frac{2\pi m_n^* kT}{h^2} \right)^{3/2}

其中,Si 的 Nc=2.8×1019cm3N_c = 2.8 \times 10^{19}\,\text{cm}^{-3} (Effective DOS of conduction band, 导带有效态密度)

P-type Semiconductor Distribution | P 型载流子分布

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Equilibrium Hole Concentration | 平衡空穴浓度

p=Nve(EFEv)/kT,where Nv=2(2πmpkTh2)3/2p = N_v\, e^{-(E_F - E_v) / kT}, \quad \text{where } N_v = 2 \left( \frac{2\pi m_p^* kT}{h^2} \right)^{3/2}

其中,Si 的 Nv=1.04×1019cm3N_v = 1.04 \times 10^{19}\,\text{cm}^{-3} (Effective DOS of valence band, 价带有效态密度)

Intrinsic Carrier Concentration | 本征载流子浓度

ni=NcNv  eEG/2kTn_i = \sqrt{N_c N_v}\; e^{-E_G / 2kT}

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Lecture 1:摩尔定律与 CMOS
Lecture 3:费米能级、载流子散射与迁移率

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